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  • Book
  • © 1992

Scanning Electron Microscopy and X-Ray Microanalysis

A Text for Biologists, Materials Scientists, and Geologists

Authors:

  1. Joseph I. Goldstein

    1. Lehigh University, Bethlehem, USA

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  2. Dale E. Newbury

    1. National Institute of Standards and Technology, Gaithersburg, USA

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  3. Patrick Echlin

    1. University of Cambridge, Cambridge, England

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  4. David C. Joy

    1. University of Tennessee, Knoxville, USA

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  5. A. D. Romig

    1. Sandia National Laboratories, Albuquerque, USA

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  6. Charles E. Lyman

    1. Lehigh University, Bethlehem, USA

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  7. Charles Fiori

    1. National Institute of Standards and Technology, Gaithersburg, USA

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  8. Eric Lifshin

    1. General Electric Corporate Research and Development, Schenectady, USA

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Table of contents (14 chapters)

  1. Front Matter

    Pages i-xviii
    PDF

  2. Introduction

    • Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, A. D. Romig Jr., Charles E. Lyman et al.
    Pages 1-19

  3. Electron Optics

    • Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, A. D. Romig Jr., Charles E. Lyman et al.
    Pages 21-68

  4. Electron-Specimen Interactions

    • Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, A. D. Romig Jr., Charles E. Lyman et al.
    Pages 69-147

  5. Image Formation and Interpretation

    • Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, A. D. Romig Jr., Charles E. Lyman et al.
    Pages 149-271

  6. X-Ray Spectral Measurement: WDS and EDS

    • Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, A. D. Romig Jr., Charles E. Lyman et al.
    Pages 273-339

  7. Qualitative X-Ray Analysis

    • Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, A. D. Romig Jr., Charles E. Lyman et al.
    Pages 341-364

  8. X-Ray Peak and Background Measurements

    • Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, A. D. Romig Jr., Charles E. Lyman et al.
    Pages 365-393

  9. Quantitative X-Ray Analysis: The Basics

    • Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, A. D. Romig Jr., Charles E. Lyman et al.
    Pages 395-416

  10. Quantitative X-Ray Analysis: Theory and Practice

    • Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, A. D. Romig Jr., Charles E. Lyman et al.
    Pages 417-523

  11. Compositional Imaging

    • Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, A. D. Romig Jr., Charles E. Lyman et al.
    Pages 525-545

  12. Specimen Preparation for Inorganic Materials: Microstructural and Microchemical Analysis

    • Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, A. D. Romig Jr., Charles E. Lyman et al.
    Pages 547-570

  13. Sample Preparation for Biological, Organic, Polymeric, and Hydrated Materials

    • Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, A. D. Romig Jr., Charles E. Lyman et al.
    Pages 571-670

  14. Coating and Conductivity Techniques for SEM and Microanalysis

    • Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, A. D. Romig Jr., Charles E. Lyman et al.
    Pages 671-740

  15. Data Base

    • Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, A. D. Romig Jr., Charles E. Lyman et al.
    Pages 741-785

  16. Back Matter

    Pages 787-820
    PDF
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About this book

In the last decade, since the publication of the first edition of Scanning Electron Microscopy and X-ray Microanalysis, there has been a great expansion in the capabilities of the basic SEM and EPMA. High­ resolution imaging has been developed with the aid of an extensive range of field emission gun (FEG) microscopes. The magnification ranges of these instruments now overlap those of the transmission electron microscope. Low-voltage microscopy using the FEG now allows for the observation of noncoated samples. In addition, advances in the develop­ ment of x-ray wavelength and energy dispersive spectrometers allow for the measurement of low-energy x-rays, particularly from the light elements (B, C, N, 0). In the area of x-ray microanalysis, great advances have been made, particularly with the "phi rho z" [Ij)(pz)] technique for solid samples, and with other quantitation methods for thin films, particles, rough surfaces, and the light elements. In addition, x-ray imaging has advanced from the conventional technique of "dot mapping" to the method of quantitative compositional imaging. Beyond this, new software has allowed the development of much more meaningful displays for both imaging and quantitative analysis results and the capability for integrating the data to obtain specific information such as precipitate size, chemical analysis in designated areas or along specific directions, and local chemical inhomogeneities.
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Keywords

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Reviews

From a review of the first edition:
`The emphasis throughout has been on practical aspects ... that approach, plus the comprehensiveness of the material covered, makes this a valuable, virtually indispensible, reference work.'
Microscope Journal
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Authors and Affiliations

  • Lehigh University, Bethlehem, USA

    Joseph I. Goldstein, Charles E. Lyman

  • National Institute of Standards and Technology, Gaithersburg, USA

    Dale E. Newbury, Charles Fiori

  • University of Cambridge, Cambridge, England

    Patrick Echlin

  • University of Tennessee, Knoxville, USA

    David C. Joy

  • Sandia National Laboratories, Albuquerque, USA

    A. D. Romig

  • General Electric Corporate Research and Development, Schenectady, USA

    Eric Lifshin

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Bibliographic Information

  • Book Title: Scanning Electron Microscopy and X-Ray Microanalysis

  • Book Subtitle: A Text for Biologists, Materials Scientists, and Geologists

  • Authors: Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, A. D. Romig, Charles E. Lyman, Charles Fiori, … Eric Lifshin

  • DOI: https://doi.org/10.1007/978-1-4613-0491-3

  • Publisher: Springer New York, NY

  • eBook Packages: Springer Book Archive

  • Copyright Information: Plenum Press, New York 1992

  • Softcover ISBN: 978-1-4612-7653-1Published: 28 September 2011

  • eBook ISBN: 978-1-4613-0491-3Published: 06 December 2012

  • Edition Number: 2

  • Number of Pages: 840

  • Topics: Earth Sciences, general, Developmental Biology, Characterization and Evaluation of Materials

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Buy it now

eBook USD 84.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book USD 109.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Other ways to access

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