When

Wednesday, September 11, 2019 from 12:00 PM to 1:00 PM EDT
Add to Calendar

Where

Georgia Institute Of Technology

Pettit Microelectronics Building 102A
791 Atlantic Dr NW
Atlanta, GA 30332

Event Address Map
Driving Directions

Contact

Eric Woods
Georgia Tech Materials Characterization Facility
404.385.2877
christa.ernst@ien.gatech.edu

Atom Probe Tomography for Atomic Scale Characterization and Biomaterials Analysis

This talk will cover APT operational theory, an introduction to sample prep and data reconstruction, and an overview of various applications. A commercial cryo-UHV solution for FIB-APT specimen transfer will also be presented.

Registration is closed. This event has already been held.